JAXA Repository / AIREX 未来へ続く、宙(そら)への英知

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titleTime-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETs
DOIinfo:doi/10.1109/TNS.2006.886234
Reference URLhttp://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=4033181
Author(jpn)小林, 大輔; 会見, 真宏; 齋藤, 宏文; 廣瀬, 和之
Author(eng)Kobayashi, Daisuke; Aimi, Masahiro; Saito, Hirobumi; Hirose, Kazuyuki
Author Affiliation(jpn)宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 総合研究大学院大学; 東京大学; 宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 東京大学; 宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 総合研究大学院大学
Author Affiliation(eng)Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate University for Advanced Studies; Department of Electronic Engineering, School of Engineering, The University of Tokyo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Department of Electronic Engineering, School of Engineering,The University of Tokyo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate University for Advanced Studies
Issue Date2006-12
PublisherInstitute of Electrical and Electronics Engineers, Inc.
Publication titleIEEE Transactions on Nuclear Science
Volume53
Issue6(1)
Start page3372
End page3378
Publication date2006-12
Languageeng
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
NCIDAA00667999
SHI-NOSA1000561000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/1014


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