JAXA Repository / AIREX 未来へ続く、宙(そら)への英知

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titleProton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates
DOIinfo:doi/10.1109/TNS.2011.2109967
Author(jpn)小林, 大輔; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; 廣瀬, 和之; Claeys, Cor
Author(eng)Kobayashi, Daisuke; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; Hirose, Kazuyuki; Claeys, Cor
Author Affiliation(jpn)imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven; imec, B-3001 Leuven, Belgium; Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, with imec, B-3001 Leuven, Belgium : SCK・CEN, the Belgian Nuclear Research Centre, B-2400 Mol, Belgium; imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium; ESTEC, 2200 AG Noordwijk, The Netherlands; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) 宇宙探査工学研究系; imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Author Affiliation(eng)imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven; imec, B-3001 Leuven, Belgium; Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, with imec, B-3001 Leuven, Belgium : SCK・CEN, the Belgian Nuclear Research Centre, B-2400 Mol, Belgium; imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium; ESTEC, 2200 AG Noordwijk, The Netherlands; Department of Spacecraft Engineering, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); imec, B-3001 Leuven, Belgium : Electrical Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Issue Date2011-06
PublisherInstitute of Electrical and Electronics Engineers
Inc.
Publication titleIEEE Transactions on Nuclear Science
Volume58
Issue3
Start page800
End page807
Publication date2011-06
Languageeng
DescriptionAccepted: 2011-01-24
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
NCIDAA00667999
SHI-NOSA1002700000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/12146


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