JAXA Repository / AIREX 未来へ続く、宙(そら)への英知
64382013.pdf1.53 MB
Other TitleMeasurement of distribution of photoemission current for some kinds of insulators
Author(jpn)伊藤, 広和; 生井, 諭司; 山納, 康; 小林, 信一; 仁田, 工美
Author(eng)Ito, Hirokazu; Namai, Satoshi; Yamano, Yasushi; Kobayashi, Shinichi; Nitta, Kumi
Author Affiliation(jpn)埼玉大学; 埼玉大学; 埼玉大学; 埼玉大学; 宇宙航空研究開発機構
Author Affiliation(eng)Saitama University; Saitama University; Saitama University; Saitama University; Japan Aerospace Exploration Agency (JAXA)
Issue Date2009-03-31
PublisherJapan Aerospace Exploration Agency (JAXA)
Publication titleJAXA special publication: Proceeding of the 5th Spacecraft Environment Symposium
宇宙航空研究開発機構特別資料: 第5回「宇宙環境シンポジウム」講演論文集
Publication date2009-03-31
AbstractVarious materials such as the thermal control film, Paint-type coating materials, some kinds of insulators are used for artificial satellites. This report describes results of distributions of the photoemission current, for them excited by ultraviolet-light. The used film samples were two kinds of germanium coating materials. The painting samples were two kinds of white paint materials (inorganic conductive) which are used for the surface of antenna part in artificial satellite. Insulator samples are four materials (PIFE, Alumina, laminate board and soda glass). In addition, two composite samples which are composed of the metal and the insulator are prepared for the measurement of photoemission. The one is an insulator chip pasted on the metal board and the other is a metal chip pasted on an insulator board. The following measurement results were obtained. The photoemission current value of the Au sample around the insulator become smaller than that of metal samples. The distribution of photoemission current of the insulator on the metal influence around the insulator as well as other insulator samples. The photoemission current value of the metal chip on the insulator board is remarkably small as well as that of insulator material.
Description形態: カラー図版あり
会議情報: 第5回宇宙環境シンポジウム(2008年12月18日-12月19日. つくば国際会議場)
KeywordsElectron emission microscope, Photoelectron emission, electron current; 放出型電子顕微鏡、光電子放出、電子電流
Document TypeTechnical Report
JAXA Category特別資料
Report NoJAXA-SP-08-018

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