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Total Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology
https://jaxa.repo.nii.ac.jp/records/4330
https://jaxa.repo.nii.ac.jp/records/43300cc4d926-ec0c-4966-98a8-f13919b2e0ba
名前 / ファイル | ライセンス | アクション |
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61889036.pdf (525.4 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Total Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | ELDRS | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | NIEL | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Total dose | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
Scheick, Leif
× Scheick, Leif× Johnston, Allan× Adell, Philippe× Irom, Farokh× McClure, Steve |
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著者所属 | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属 | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属 | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属 | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属 | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Jet Propulsion Laboratory, California Institute of Technology | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構(JAXA) | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication 巻 JAXA-SP-12-008E, p. 168-174, 発行日 2013-03-29 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Over the last 50 years, the effects of cumulative radiation damage in microelectronics, and now nanoelectronics, have continually presented a design and assurance challenge to space flight missions. Feature sizes, that is, the size of the unit structure in microelectronics, has continually decreased, which has presented an added complexity to testing and assuring microelectronic devices. This paper outlines the paradigm shifts of total ionizing dose (TID) and displacement damage (DD) effects as device sizes have reduced and highlights some of the strategies developed to insert apply microelectronics into space. The current trends of the technology are analyzed in context of future JPL and NASA missions. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0061889036 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-12-008E |