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titleExperimental Investigation on Material Properties due to Simulating Space Environments Degradation of CMG100-AR Solar Cell Coverglass
Author(jpn)遠藤, 泰史; 岩田, 稔; 豊田, 和弘; 奥村, 哲平; 高橋, 眞人; 趙, 孟佑
Author(eng)Chen, Yu; Endo, Taishi; Iwata, Minoru; Toyoda, Kazuhiro; Okumura, Teppei; Takahashi, Masato; Cho, Mengu
Author Affiliation(jpn)九州工業大学宇宙環境技術研究センター; 九州工業大学宇宙環境技術研究センター; 九州工業大学宇宙環境技術研究センター; 九州工業大学宇宙環境技術研究センター; 宇宙航空研究開発機構 (JAXA); 宇宙航空研究開発機構 (JAXA); 九州工業大学宇宙環境技術ラボラトリー
Author Affiliation(eng)Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology; Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology; Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology; Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology; Japan Aerospace Exploration Agency (JAXA); Japan Aerospace Exploration Agency (JAXA); Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology
Issue Date2012-02-20
Publisher宇宙航空研究開発機構
Japan Aerospace Exploration Agency (JAXA)
Publication title宇宙航空研究開発機構特別資料: 第8回宇宙環境シンポジウム講演論文集
JAXA special publication: Proceedings of the 8th Spacecraft Environment Symposium
VolumeJAXA-SP-11-012
Start page149
End page154
Publication date2012-02-20
Languageeng
AbstractThe CMG100-AR solar cell coverglasses suffered with simulating space environments, such as, thermal cycling, protons irradiation and electrons irradiation. Their dielectric constant, vacuum volume resistivity, total electron emission yield, and FTIR and UV-VIS-NIR spectrums are measured. The spectrum analysis considering to the color centers related to the change of material properties is discussed.
DescriptionPhysical characteristics: Original contains color illustrations
Meeting Information: 8th Spacecraft Enivironment Symposium (October 18-19, 2011, Tokyo Big Sight), Tokyo Japan
形態: カラー図版あり
会議情報: 第8回宇宙環境シンポジウム (2011年10月18-19日. 東京国際展示場), 東京
KeywordsSolar cell coverglass; degradation; total electron emission yield; spectrum analysis
Document TypeConference Paper
JAXA Category特別資料
ISSN1349-113X
NCIDAA11984031
SHI-NOAA0065159020
Report NoJAXA-SP-11-012
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/15852


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