JAXA Repository / AIREX 未来へ続く、宙(そら)への英知

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titleLET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell
DOIinfo:doi/10.1109/TNS.2008.2009054
Reference URLhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4782171
Author(jpn)牧野, 高紘; 小林, 大輔; 廣瀬, 和之; 柳川, 善光; 齋藤, 宏文; 池田, 博一; 高橋, 大輔; 石井, 茂; 草野, 将樹; 小野田, 忍; 平尾, 敏雄; 大島, 武
Author(eng)Makino, T.; Kobayashi, Daisuke; Hirose, Kazuyuki; Yanagawa, Y.; Saito, Hirobumi; Ikeda, Hirokazu; Takahashi, D.; Ishii, S.; Kusano, M.; Onoda, S.; Hirao, T.; Ohshima, T.
Author Affiliation(jpn)宇宙航空研究開発機構 (JAXA); 宇宙航空研究開発機構 (JAXA); 宇宙航空研究開発機構 (JAXA); 宇宙航空研究開発機構 (JAXA)
Author Affiliation(eng)Graduate Univ. Advanced Studies; Graduate Univ. Advanced Studies; Japan Aerospace Exploration Agency (JAXA); Graduate Univ. Advanced Studies; Japan Aerospace Exploration Agency (JAXA); Univ. Tokyo; Japan Aerospace Exploration Agency (JAXA); Univ. Tokyo; Graduate Univ. Advanced Studies; Japan Aerospace Exploration Agency (JAXA); Mitsubishi Heavy Ind. Ltd.; Mitsubishi Heavy Ind. Ltd.; Mitsubishi Heavy Ind. Ltd.; Japan Atomic Energy Agency; Japan Atomic Energy Agency; Japan Atomic Energy Agency
Issue Date2008
PublisherThe Institute of Electrical and Electronic Engineers (IEEE)
Publication titleIEEE Transactions on Nuclear Science
Volume56
Issue1
Start page202
End page207
Publication date2008
Languageeng
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
SHI-NOPAIS08147000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/19019


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