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titleInfluence of 60-MeV Proton-Irradiation on Standard and Strained n- and p-Channel MuGFETs
DOIinfo:doi/10.1109/TNS.2012.2187070
Author(jpn)Agopian, Paula G. D.; Martino, Joao A.; 小林, 大輔; Simoen, Eddy; Claeys, Cor
Author(eng)Agopian, Paula G. D.; Martino, Joao A.; Kobayashi, Daisuke; Simoen, Eddy; Claeys, Cor
Author Affiliation(jpn)Integrated Laboratory Systems (LSI), University of Sao Paulo : Electrical Engineering Department, Centro Universitario da FEI; Integrated Laboratory Systems (LSI), University of Sao Paulo; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS); Imec; Imec : Electrical Engineering Department, Katholieke Universiteit Leuven
Author Affiliation(eng)Integrated Laboratory Systems (LSI), University of Sao Paulo : Electrical Engineering Department, Centro Universitario da FEI; Integrated Laboratory Systems (LSI), University of Sao Paulo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); Imec; Imec : Electrical Engineering Department, Katholieke Universiteit Leuven
Issue Date2012
PublisherInstitute of Electrical and Electronics Engineers
Publication titleIEEE Transactions on Nuclear Science
Volume59
Issue4
Start page707
End page713
Publication date2012
Languageeng
DescriptionAccepted: 2012-01-31
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
NCIDAA00667999
SHI-NOSA1003619000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/1975


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