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titleEstimation of volume resistivity of dielectric films under electron irradiation
Other TitleEstimation of volume resistivity of dielectric films under electron irradiation
Author(jpn)渡邉 力夫; 三宅 弘晃; 仁田 工美
Author(eng)Watanabe, Rikio; Miyake, Hiroaki; Nitta, Kumi
Author Affiliation(jpn)武蔵工業大学; 宇宙航空研究開発機構; 宇宙航空研究開発機構
Author Affiliation(eng)Musashi Institute of Technology; Japan Aerospace Exploration Agency (JAXA); Japan Aerospace Exploration Agency (JAXA)
Issue Date2008-03-31
PublisherJapan Aerospace Exploration Agency (JAXA)
Publication title第4回宇宙環境シンポジウム講演論文集
Proceedings of the 4th Spacecraft Environment Symposium
Start page105
End page106
Publication date2008-03-31
AbstractA new measurement method for volume resistivity of dielectric material has been tested and compared to the standard ASTM (American Society for Testing and Materials) 'capacitor method'. This is intended for obtaining resistivity values of highly insulated material for spacecraft surface under realistic condition which simulates vacuum and electron beam irradiation. The resistivity value is calculated from exponential decay time constant of surface potential after electron beam irradiation ceased. The results show that the resistivity value from present method is 10(exp 3) times larger than that obtained from capacitor method. This indicates that charged dielectrics need much longer field relaxation time which would cause reconsideration of current spacecraft design guideline and charge analysis.
DescriptionJAXA Special Publication
Keywordsvolume resistivity; dielectric; electron irradiation; aerospace environment; satellite design; spacecraft construction material; electron beam; satellite surface; electric field; polyimide; spacecraft charging; 体積抵抗率; 誘電体; 電子照射; 航空宇宙環境; 衛星設計; 宇宙機構造材料; 電子ビーム; 衛星表面; 電場; ポリイミド; 宇宙機帯電
Document TypeConference Paper
JAXA Category特別資料
Report NoJAXA-SP-07-030

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