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AA1630004016.pdf433.63 kB
titleMeasurement of ESD threshold voltage of coverglass (CMG100AR)
Author(jpn)Nguyen, Duc Minh; Khan, Arifur Rahman; 豊田, 和弘; 趙, 孟佑
Author(eng)Nguyen, Duc Minh; Khan, Arifur Rahman; Toyoda, Kazuhiro; Cho, Mengu
Author Affiliation(jpn)九州工業大学; 九州工業大学; 九州工業大学; 九州工業大学
Author Affiliation(eng)Kyushu Institute of Technology; Kyushu Institute of Technology; Kyushu Institute of Technology; Kyushu Institute of Technology
Issue Date2016-03-11
Japan Aerospace Exploration Agency (JAXA)
Publication title宇宙航空研究開発機構特別資料: 第12回宇宙環境シンポジウム講演論文集
JAXA Special Publication: Proceeding of the 12th Spacecraft Environment Symposium
Start page219
End page223
Publication date2016-03-11
AbstractCoverglass (CMG100AR) is widely used to protect the solar cell from harsh space environment. Due to surface charging, it acts as a platform where electrostatic discharge (ESD) can occur. In order to know the ESD threshold, coverglass is exposed to electron beam, measured the temporal surface potential rise until the discharge. ESD current waveform and discharge images are also recorded. ESD threshold voltage is statistically measured by Weibull distribution.
Description会議情報: 第12回 宇宙環境シンポジウム(2015年11月16日-18日. 北九州国際会議場 国際会議室), 北九州市, 福岡県
形態: カラー図版あり
Meeting Information: The 12th Spacecraft Environment Symposium (November 16-18, 2015. International Conference Room, Kitakyushu International Conference Center), Kitakyushu, Fukuoka, Japan
Physical characteristics: Original contains color illustrations
KeywordsSolar cell coverglass; current density; vacuum chamber; space environment; surface potential distribution; electron beam; Atomic Oxygen
Document TypeConference Paper
JAXA Category特別資料
NASA Subject CategorySpacecraft Design, Testing and Performance
Report NoJAXA-SP-15-012

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