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titleHeavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets
DOIinfo:doi/10.1109/TNS.2017.2774805
Author(jpn)小林, 大輔; 廣瀬, 和之; 伊藤, 大智; 梯, 友哉; 川崎, 治; 牧野, 高紘; 大島, 武; 松浦, 大介; 成田, 貴則; 加藤, 昌浩; 石井, 茂; 益川, 一範
Author(eng)Kobayashi, Daisuke; Hirose, Kazuyuki; Ito, Taichi; Kakehashi, Yuya; Kawasaki, Osamu; Makino, Takahiro; Ohshima, Takeshi; Matsuura, Daisuke; Narita, Takanori; Kato, Masahiro; Ishii, Shigeru; Masukawa, Kazunori
Author Affiliation(jpn)宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学; 宇宙航空研究開発機構研究開発部門 (JAXA); 宇宙航空研究開発機構研究開発部門 (JAXA); 宇宙航空研究開発機構研究開発部門 (JAXA); 量子科学技術研究開発機構; 量子科学技術研究開発機構; 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社
Author Affiliation(eng)Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo; Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA); Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA); Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA); National Institutes for Quantum and Radiological Science and Technology; National Institutes for Quantum and Radiological Science and Technology; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.
Issue Date2018-01
PublisherInstitute of Electrical and Electronics Engineers
Publication titleIEEE Transactions on Nuclear Science
Volume65
Issue1
Start page523
End page532
Publication date2018-01
Languageeng
Description著者人数: 12名
Accepted: 2017-11-14
KeywordsIon radiation effects; radiation hardening; semiconductor device reliability; silicon-on-insulator (SOI) technologies; single-event upsets; soft errors
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
ISSN(online)1558-1578
NCIDAA00667999
SHI-NOSA1170193000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/871225


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