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titleEstimation of Single Event Transient Voltage Pulses in VLSI Circuts From Heavy-Ion-Induced Transient Currents Measured in a Single MOSFET
DOIinfo:doi/10.1109/TNS.2007.891397
Author(jpn)小林, 大輔; 齋藤, 宏文; 廣瀬, 和之
Author(eng)Kobayashi, Daisuke; Saito, Hirobumi; Hirose, Kazuyuki
Author Affiliation(jpn)宇宙航空研究開発機構宇宙科学研究本部 (JAXA)(ISAS); 宇宙航空研究開発機構宇宙科学研究本部 (JAXA)(ISAS); 宇宙航空研究開発機構宇宙科学研究本部 (JAXA)(ISAS)
Author Affiliation(eng)Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS)
Issue Date2007
PublisherIEEE
Publication titleIEEE Transactions on Nuclear Science
Volume54
Issue4
Start page1037
End page1041
Publication date2007
Languageeng
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
NCIDAA00667999
SHI-NOSA1000135000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/8736


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