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titleLaser Visualization of the Development of Long Line-Type Mutli-Cell Upsets in Back-Biased SOI SRAMs
DOIinfo:doi/10.1109/TNS.2017.2776169
Author(jpn)井辻, 宏章; 小林, 大輔; 川崎, 治; 松浦, 大介; 成田, 貴則; 加藤, 昌浩; 石井, 茂; 益川, 一範; 廣瀬, 和之
Author(eng)Itsuji, Hiroaki; Kobayashi, Daisuke; Kawasaki, Osamu; Matsuura, Daisuke; Narita, Takanori; Kato, Masahiro; Ishii, Shigeru; Masukawa, Kazunori; Hirose, Kazuyuki
Author Affiliation(jpn)東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS); 東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS); Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA); 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社; 三菱重工業株式会社; 東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS)
Author Affiliation(eng)Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS); Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA); Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Mitsubishi Heavy Industries, Ltd.; Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS)
Issue Date2018-01
PublisherInstitute of Electrical and Electronics Engineers
Publication titleIEEE Transactions on Nuclear Science
Volume65
Issue1
Start page346
End page353
Publication date2018-01
Languageeng
DescriptionAccepted: 2017-11-14
KeywordsMultiple-cell upset (MCU); silicon-oninsulator (SOI) technologies; single-event upset (SEU); static random access memory (SRAM); two-photon absorption (TPA)
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
ISSN(online)1558-1578
NCIDAA00667999
SHI-NOSA1170249000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/875871


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