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titleThe Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
DOIinfo:doi/10.1109/TNS.2018.2830781
Author(jpn)加藤, 貴志; Yamazaki, Takashi; Maruyama, Kazunori; Soeda, Takeshi; 井辻, 宏章; 小林, 大輔; 廣瀬, 和之; 松山, 英也
Author(eng)Kato, Takashi; Yamazaki, Takashi; Maruyama, Kazunori; Soeda, Takeshi; Itsuji, Hiroaki; Kobayashi, Daisuke; Hirose, Kazuyuki; Matsuyama, Hideya
Author Affiliation(jpn)株式会社ソシオネクスト; 富士通研究所; 富士通研究所; 富士通研究所; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学; 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学; 株式会社ソシオネクスト
Author Affiliation(eng)Reliability and Quality Assurance Department, Socionext Inc.; Applied Innovation Research Center, Fujitsu Laboratories Ltd.; Applied Innovation Research Center, Fujitsu Laboratories Ltd.; Applied Innovation Research Center, Fujitsu Laboratories Ltd.; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo; Reliability and Quality Assurance Department, Socionext Inc.
Issue Date2018-08
PublisherInstitute of Electrical and Electronics Engineers
Publication titleIEEE Transactions on Nuclear Science
Volume65
Issue8
Start page1900
End page1907
Publication date2018-08
Languageeng
DescriptionAccepted: 2018-03-26
KeywordsCMOS; fail bit map (FBM); multiple-bit upset (MBU); multiple-cell upset (MCU); parasitic bipolar effect (PBE); single-event upset (SEU); SRAM; two-photon absorption (TPA)
Document TypeJournal Article
JAXA Category学術雑誌論文
ISSN0018-9499
NCIDAA00667999
SHI-NOSA1180070000
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/898468


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