WEKO3
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The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM
https://jaxa.repo.nii.ac.jp/records/29847
https://jaxa.repo.nii.ac.jp/records/29847c0039d66-fd56-4aa1-87c6-948ed36d0acc
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2018-11-05 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | CMOS | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | fail bit map (FBM) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | multiple-bit upset (MBU) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | multiple-cell upset (MCU) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | parasitic bipolar effect (PBE) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | single-event upset (SEU) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | SRAM | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | two-photon absorption (TPA) | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
加藤, 貴志
× 加藤, 貴志× Yamazaki, Takashi× Maruyama, Kazunori× Soeda, Takeshi× 井辻, 宏章× 小林, 大輔× 廣瀬, 和之× 松山, 英也× Kato, Takashi× Yamazaki, Takashi× Maruyama, Kazunori× Soeda, Takeshi× Itsuji, Hiroaki× Kobayashi, Daisuke× Hirose, Kazuyuki× Matsuyama, Hideya |
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著者所属 | ||||||
株式会社ソシオネクスト | ||||||
著者所属 | ||||||
富士通研究所 | ||||||
著者所属 | ||||||
富士通研究所 | ||||||
著者所属 | ||||||
富士通研究所 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学 | ||||||
著者所属 | ||||||
株式会社ソシオネクスト | ||||||
著者所属(英) | ||||||
en | ||||||
Reliability and Quality Assurance Department, Socionext Inc. | ||||||
著者所属(英) | ||||||
en | ||||||
Applied Innovation Research Center, Fujitsu Laboratories Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Applied Innovation Research Center, Fujitsu Laboratories Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Applied Innovation Research Center, Fujitsu Laboratories Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Department of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Reliability and Quality Assurance Department, Socionext Inc. | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers | |||||
書誌情報 |
en : IEEE Transactions on Nuclear Science 巻 65, 号 8, p. 1900-1907, 発行日 2018-08 |
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内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2018-03-26 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9499 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667999 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TNS.2018.2830781 | |||||
関連名称 | info:doi/10.1109/TNS.2018.2830781 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1180070000 |