WEKO3
アイテム
{"_buckets": {"deposit": "7b3070ee-17bc-4c3c-8109-80db33607c65"}, "_deposit": {"created_by": 1, "id": "30114", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "30114"}, "status": "published"}, "_oai": {"id": "oai:jaxa.repo.nii.ac.jp:00030114", "sets": ["1888"]}, "author_link": ["392047", "392042", "392057", "392048", "392052", "392046", "392035", "392041", "392040", "392054", "392050", "392055", "392044", "392058", "392038", "392056", "392051", "392037", "392049", "392053", "392034", "392033", "392039", "392043", "392045", "392036"], "item_7_biblio_info_10": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2019-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "162", "bibliographicPageStart": "155", "bibliographicVolumeNumber": "66", "bibliographic_titles": [{}, {"bibliographic_title": "IEEE Transactions on Nuclear Science", "bibliographic_titleLang": "en"}]}]}, "item_7_description_18": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "著者人数: 13名", "subitem_description_type": "Other"}]}, "item_7_description_19": {"attribute_name": "内容記述(英)", "attribute_value_mlt": [{"subitem_description": "Accepted: 2018-11-13", "subitem_description_type": "Other"}]}, "item_7_description_32": {"attribute_name": "資料番号", "attribute_value_mlt": [{"subitem_description": "資料番号: SA1180337000", "subitem_description_type": "Other"}]}, "item_7_publisher_9": {"attribute_name": "出版者(英)", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electrical and Electronics Engineers (IEEE)"}]}, "item_7_relation_25": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "info:doi/10.1109/TNS.2018.2882221"}], "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/TNS.2018.2882221", "subitem_relation_type_select": "DOI"}}]}, "item_7_source_id_21": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0018-9499", "subitem_source_identifier_type": "ISSN"}]}, "item_7_source_id_22": {"attribute_name": "ISSNONLINE", "attribute_value_mlt": [{"subitem_source_identifier": "1558-1578", "subitem_source_identifier_type": "ISSN"}]}, "item_7_source_id_24": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00667999", "subitem_source_identifier_type": "NCID"}]}, "item_7_text_35": {"attribute_name": "JAXAカテゴリ", "attribute_value_mlt": [{"subitem_text_value": "JAXAカテゴリ: 学術雑誌論文"}]}, "item_7_text_36": {"attribute_name": "JAXAカテゴリ2", "attribute_value_mlt": [{"subitem_text_value": "JAXAカテゴリ2: IS"}]}, "item_7_text_43": {"attribute_name": "DSpaceコレクション番号", "attribute_value_mlt": [{"subitem_text_value": "DSpaceコレクション番号: 11"}]}, "item_7_text_6": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学"}, {"subitem_text_value": "東京大学"}, {"subitem_text_value": "宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学"}, {"subitem_text_value": "宇宙航空研究開発機構研究開発部門 (JAXA)"}, {"subitem_text_value": "宇宙航空研究開発機構研究開発部門 (JAXA)"}, {"subitem_text_value": "量子科学技術研究開発機構"}, {"subitem_text_value": "量子科学技術研究開発機構"}, {"subitem_text_value": "三菱重工業株式会社"}, {"subitem_text_value": "三菱重工業株式会社"}, {"subitem_text_value": "三菱重工業株式会社"}, {"subitem_text_value": "三菱重工業株式会社"}, {"subitem_text_value": "三菱重工業株式会社"}, {"subitem_text_value": "三菱重工業株式会社"}]}, "item_7_text_7": {"attribute_name": "著者所属(英)", "attribute_value_mlt": [{"subitem_text_language": "en", "subitem_text_value": "Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo"}, {"subitem_text_language": "en", "subitem_text_value": "Graduate School of Engineering, The University of Tokyo"}, {"subitem_text_language": "en", "subitem_text_value": "Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo"}, {"subitem_text_language": "en", "subitem_text_value": "Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA)"}, {"subitem_text_language": "en", "subitem_text_value": "Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA)"}, {"subitem_text_language": "en", "subitem_text_value": "National Institutes for Quantum and Radiological Science and Technology"}, {"subitem_text_language": "en", "subitem_text_value": "National Institutes for Quantum and Radiological Science and Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}, {"subitem_text_language": "en", "subitem_text_value": "Mitsubishi Heavy Industries, Ltd."}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "metadata only access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_14cb"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "小林, 大輔"}], "nameIdentifiers": [{"nameIdentifier": "392033", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayashi, Naoki"}], "nameIdentifiers": [{"nameIdentifier": "392034", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "廣瀬, 和之"}], "nameIdentifiers": [{"nameIdentifier": "392035", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "梯, 友哉"}], "nameIdentifiers": [{"nameIdentifier": "392036", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "川崎, 治"}], "nameIdentifiers": [{"nameIdentifier": "392037", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "牧野, 高紘"}], "nameIdentifiers": [{"nameIdentifier": "392038", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "大島, 武"}], "nameIdentifiers": [{"nameIdentifier": "392039", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "松浦, 大介"}], "nameIdentifiers": [{"nameIdentifier": "392040", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Mori, Yoshiharu"}], "nameIdentifiers": [{"nameIdentifier": "392041", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kusano, Masaki"}], "nameIdentifiers": [{"nameIdentifier": "392042", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "成田, 貴則"}], "nameIdentifiers": [{"nameIdentifier": "392043", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "石井, 茂"}], "nameIdentifiers": [{"nameIdentifier": "392044", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "益川, 一範"}], "nameIdentifiers": [{"nameIdentifier": "392045", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kobayashi, Daisuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392046", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayashi, Naoki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392047", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hirose, Kazuyuki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392048", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kakehashi, Yuya", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392049", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kawasaki, Osamu", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392050", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Makino, Takahiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392051", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ohshima, Takeshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392052", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsuura, Daisuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392053", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Mori, Yoshiharu", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392054", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kusano, Masaki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392055", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Narita, Takanori", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392056", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ishii, Shigeru", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392057", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Masukawa, Kazunori", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "392058", "nameIdentifierScheme": "WEKO"}]}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Data retention voltage", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "error analysis", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "integrated circuit reliability", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "ion radiation effects", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "neutron radiation effects", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "quality management", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "radiation hardening", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "static noise margin", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "static random access memory (SRAM) cells", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "SRAM chips.", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage", "subitem_title_language": "en"}]}, "item_type_id": "7", "owner": "1", "path": ["1888"], "permalink_uri": "https://jaxa.repo.nii.ac.jp/records/30114", "pubdate": {"attribute_name": "公開日", "attribute_value": "2019-04-03"}, "publish_date": "2019-04-03", "publish_status": "0", "recid": "30114", "relation": {}, "relation_version_is_last": true, "title": ["Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage"], "weko_shared_id": -1}
Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage
https://jaxa.repo.nii.ac.jp/records/30114
https://jaxa.repo.nii.ac.jp/records/3011497e95483-d35e-451e-8853-70ac643d21d8
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2019-04-03 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Data retention voltage | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | error analysis | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | integrated circuit reliability | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | ion radiation effects | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | neutron radiation effects | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | quality management | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | radiation hardening | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | static noise margin | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | static random access memory (SRAM) cells | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | SRAM chips. | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
小林, 大輔
× 小林, 大輔× Hayashi, Naoki× 廣瀬, 和之× 梯, 友哉× 川崎, 治× 牧野, 高紘× 大島, 武× 松浦, 大介× Mori, Yoshiharu× Kusano, Masaki× 成田, 貴則× 石井, 茂× 益川, 一範× Kobayashi, Daisuke× Hayashi, Naoki× Hirose, Kazuyuki× Kakehashi, Yuya× Kawasaki, Osamu× Makino, Takahiro× Ohshima, Takeshi× Matsuura, Daisuke× Mori, Yoshiharu× Kusano, Masaki× Narita, Takanori× Ishii, Shigeru× Masukawa, Kazunori |
|||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学 | ||||||
著者所属 | ||||||
東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構研究開発部門 (JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構研究開発部門 (JAXA) | ||||||
著者所属 | ||||||
量子科学技術研究開発機構 | ||||||
著者所属 | ||||||
量子科学技術研究開発機構 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属 | ||||||
三菱重工業株式会社 | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
National Institutes for Quantum and Radiological Science and Technology | ||||||
著者所属(英) | ||||||
en | ||||||
National Institutes for Quantum and Radiological Science and Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Mitsubishi Heavy Industries, Ltd. | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers (IEEE) | |||||
書誌情報 |
en : IEEE Transactions on Nuclear Science 巻 66, 号 1, p. 155-162, 発行日 2019-01 |
|||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 著者人数: 13名 | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2018-11-13 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9499 | |||||
ISSNONLINE | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1558-1578 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667999 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TNS.2018.2882221 | |||||
関連名称 | info:doi/10.1109/TNS.2018.2882221 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1180337000 |