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1. パワーダイオードの地上放射線環境における破壊のシミュレーション Simulating Degradation Mechanism of Power Diodes in Atmospheric Radiation Environments
(著者名) 高田, 育紀
(Author) Takata, Ikunori
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 29-34(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728002
2. 鉛フリー実装の航空宇宙用電子機器への適用化検討 Application of Pb-Free Solder to Space Electronics
(著者名) 池淵, 博
(Author) Ikebuchi, Hiroshi
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 78-84(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728006
3. エネルギー・環境問題とパワーエレクトロニクスの役割 Roles of Power Electronics on Energy and Environmental Issues
(著者名) 松井, 幹彦
(Author) Matsui, Mikihiko
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 5-28(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728001
4. 第20回高温エレクトロニクス研究会 Proceedings of the 20th ISAS research meeting on High Temperature Electronics
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728000
5. エナジーハーベスティングとPowerMEMS Energy Harvesting by Power MEMS
(著者名) 鈴木, 雄二
(Author) Suzuki, Yuji
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 64-77(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728005
6. Ion-Implanted GaN-HEMTs for High Temperature Operation イオン注入GaN-HEMTの高温動作
(著者名) 野本, 一貴; 中村, 徹
(Author) Nomoto, Kazuki; Nakamura, Toru
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 49-63(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) eng(資料番号) AA0064728004
7. LSIの特性変動がもたらす電源電流の変化: LSI評価への適用 LSI Supply Current Fluctuations Brought by Logic Variation: Application to LSI Evaluation
(著者名) 眞田, 克
(Author) Sanada, Masaru
(文献種別) Conference Paper
(刊行物名) 高温エレクトロニクス研究会(Journal Name) Proceedings of ISAS research meeting on High Temperature Electronics(巻) 20(ページ) 35-48(刊行年月日) 2010-07
(抄録) Meeting Information: The 20th ISAS research meeting on High Temperature Electronics (March 24, 2010....
(言語) jpn(資料番号) AA0064728003
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