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Results 21-40 of 41.

21. Development of SOI pixel process technology
(著者名) 新井, 康夫; 三好, 敏喜; 海野, 義信; ほか
(Author) Arai, Y.; Miyoshi, T.; Unno, Y.; et al.
(内容記述) 著者人数: 50名
(文献種別) Journal Article (ISSN) 0168-9002
(Journal Name) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment(巻) 636(号) 1 Supplement 1(ページ) S31-S36(刊行年月日) 2011-04-21
(言語) eng(資料番号) SA1002760000
22. High Doping Density/High Electric Field, Stress and Heterojunction Effects on the Characteristics of CMOS Compatible p-n Junctions
(著者名) Simoen, E.; Eneman, G.; Bargallo Gonzalez, M.; ほか
(Author) Simoen, E.; Eneman, G.; Bargallo Gonzalez, M.; et al.
(文献種別) Journal Article (ISSN) 0013-4651
(Journal Name) Journal of the Electrochemical Society(巻) 158(号) 5(ページ) R27-R36(刊行年月日) 2011-03-25
(言語) eng(資料番号) SA1002742000
23. 宇宙・民生デュアルユースの半導体集積回路の開発 -SOIデバイスの放射線耐性強化技術-
(著者名) 廣瀬. 和之; 齋藤, 宏文; 小林, 大輔; ほか
(Author) Hirose, Kazuyuki; Saito, Hirobumi; Kobayashi, Daisuke; et al.
(文献種別) Journal Article (ISSN) 0021-4663
(刊行物名) 日本航空宇宙学会誌(Journal Name) Journal of the Japan Society for Aeronautical and Space Sciences(巻) 59(号) 684(ページ) 8-14(刊行年月日) 2011-01-05
(言語) jpn(資料番号) SA1002830000
24. Large SET duration broadening in a fully-depleted SOI technology-mitigation with body contacts
(著者名) 小林, 大輔; 池田, 博一; 廣瀬, 和之
(Author) Ferlet-Cavrois, V.; Kobayashi, Daisuke; McMorrow, D.; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 57(号) 4(ページ) 1811-1819(刊行年月日) 2010-08
(言語) eng(資料番号) SA1002020000
25. Device-physics-based analytical model for single-event transients in SOI CMOS logic
(著者名) 小林, 大輔; 廣瀬, 和之; 牧野, 高紘; ほか
(Author) Kobayashi, Daisuke; Hirose, Kazuyuki; Ferlet-Cavrois, V.; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 56(号) 6(ページ) 3043-3049(刊行年月日) 2009-12
(言語) eng(資料番号) SA1000804000
26. Soft-error rate in a logic LSI estimated from SET pulse-width measurements
(著者名) 牧野, 高紘; 小林, 大輔; 廣瀬, 和之; ほか
(Author) Makino, T.; Kobayashi, Daisuke; Hirose, Kazuyuki; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 56(号) 6(ページ) 3180-3184(刊行年月日) 2009-12
(言語) eng(資料番号) SA1000803000
27. Experimental verification of scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems
(著者名) 柳川, 善光; 小林, 大輔; 廣瀬, 和之; ほか
(Author) Yanagawa, Y.; Kobayashi, Daisuke; Hirose, Kazuyuki; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 56(号) 4(ページ) 1958-1963(刊行年月日) 2009-08
(言語) eng(資料番号) SA1000801000
28. A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation
(著者名) 小林, 大輔; 廣瀬, 和之; 齋藤, 宏文
(Author) Ferlet-Cavrois, V.; McMorrow, D.; Kobayashi, Daisuke; et al.
(内容記述) 著者人数:18名
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 56(号) 4(ページ) 2014-2020(刊行年月日) 2009-08
(言語) eng(資料番号) SA1000802000
29. Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems
(著者名) 柳川, 善光; 小林, 大輔; 池田, 博一; ほか
(Author) Yanagawa, Y.; Kobayashi, Daisuke; Ikeda, Hirokazu; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 55(号) 4(ページ) 1947-1952(刊行年月日) 2008
(言語) eng(資料番号) PAIS08149000
30. Relationship between optical dielectric constant and XPS relative chemical shift of 1s and 2p levels for dielectric compounds
(著者名) 廣瀬, 和之; 小林, 大輔
(Author) Hirose, Kazuyuki; Suzuki, H.; Nohira, H.; et al.
(文献種別) Journal Article
(Journal Name) Journal of Physics : Conference Series(巻) 100(号) 012011(刊行年月日) 2008
(言語) eng(資料番号) PAIS08140000
31. Correlation between the dipole moment induced at the Slater transition state and the optical dielectric constant of Si and Al compounds
(著者名) 廣瀬, 和之; 小林, 大輔; 鈴木, 治彦; ほか
(Author) Hirose, Kazuyuki; Kobayashi, Daisuke; Suzuki, H.; et al.
(文献種別) Journal Article (ISSN) 0003-6951
(Journal Name) Applied Physics Letters(巻) 93(号) 19(ページ) 193503(刊行年月日) 2008
(言語) eng(資料番号) PAIS08053000
32. Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor Technique
(著者名) 小林, 大輔; 廣瀬, 和之; 柳川, 善光; ほか
(Author) Kobayashi, Daisuke; Hirose, Kazuyuki; Yanagawa, Y.; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 55(号) 6(ページ) 2872-2879(刊行年月日) 2008
(言語) eng(資料番号) PAIS08145000
33. Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
(著者名) 小林, 大輔
(Author) FERLET-CAVROIS, V.; POUGET, V.; MCMORROW, D.; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 55(号) 6(ページ) 2842-2853(刊行年月日) 2008
(言語) eng(資料番号) PAIS08148000
34. LET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell
(著者名) 牧野, 高紘; 小林, 大輔; 廣瀬, 和之; ほか
(Author) Makino, T.; Kobayashi, Daisuke; Hirose, Kazuyuki; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 56(号) 1(ページ) 202-207(刊行年月日) 2008
(言語) eng(資料番号) PAIS08147000
35. Estimation of Single Event Transient Voltage Pulses in VLSI Circuts From Heavy-Ion-Induced Transient Currents Measured in a Single MOSFET
(著者名) 小林, 大輔; 齋藤, 宏文; 廣瀬, 和之
(Author) Kobayashi, Daisuke; Saito, Hirobumi; Hirose, Kazuyuki
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 54(号) 4(ページ) 1037-1041(刊行年月日) 2007
(言語) eng(資料番号) SA1000135000
36. High-k Gate dielectric films studied by extremely asymmetric X-ray diffraction and X-ray photoelectron spectroscopy
(著者名) 伊藤, 勇希; 秋本, 晃一; 吉田, 広徳; ほか
(Author) Ito, Yuki; Akimoto, Koichi; Yoshida, Hironori; et al.
(文献種別) Journal Article (ISSN) 1742-6588
(Journal Name) Journal of Physics: Conference Series(巻) 83(ページ) 012011(刊行年月日) 2007
(言語) eng(資料番号) SA1002046000
37. Feasibility Study of a Table-Based SET-Pulse Estimation in Logic Cells From Heavy-Ion-Induced Transient Currents Measured in a Single MOSFET
(著者名) 小林, 大輔; 廣瀬, 和之; 牧野, 高紘; ほか
(Author) Kobayashi, Daisuke; Hirose, Kazuyuki; Makino, Takahiro; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 54(号) 6(ページ) 2347-2354(刊行年月日) 2007
(言語) eng(資料番号) SA1000139000
38. Time-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETs
(著者名) 小林, 大輔; 会見, 真宏; 齋藤, 宏文; ほか
(Author) Kobayashi, Daisuke; Aimi, Masahiro; Saito, Hirobumi; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 53(号) 6(1)(ページ) 3372-3378(刊行年月日) 2006-12
(言語) eng(資料番号) SA1000561000
39. Direct Measurement of SET Pulse Widths in 0.2- μm SOI Logic Cells Irradiated by Heavy Ions
(著者名) 柳川, 善光; 廣瀬, 和之; 齋藤, 宏文; ほか
(Author) Yanagawa, Y.; Hirose, Kazuyuki; Saito, Hirobumi; et al.
(文献種別) Journal Article (ISSN) 0018-9499
(Journal Name) IEEE Transactions on Nuclear Science(巻) 53(号) 6(1)(ページ) 3575-3578(刊行年月日) 2006-12
(言語) eng(資料番号) SA1000562000
40. X-ray photoelectron spectroscopy study of dielectric constant for Si compounds
(著者名) 廣瀬, 和之; 木原, 正道; 小林, 大輔; ほか
(Author) Hirose, Kazuyuki; Kihara, M.; Kobayashi, Daisuke; et al.
(内容記述) 著者人数:12名
(文献種別) Journal Article (ISSN) 0003-6951
(Journal Name) Applied Physics Letters(巻) 89(号) 15(ページ) 154103(刊行年月日) 2006-10
(言語) eng(資料番号) SA1000559000