| タイトル | Semiconductor Laser Low Frequency Noise Characterization |
| 本文（外部サイト） | http://hdl.handle.net/2060/19970022863 |
| 著者（英） | Logan, Ronald T.; Maleki, Lute |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1996-12-01 |
| 言語 | eng |
| 内容記述 | This work summarizes the efforts in identifying the fundamental noise limit in semiconductor optical sources (lasers) to determine the source of 1/F noise and it's associated behavior. In addition, the study also addresses the effects of this 1/F noise on RF phased arrays. The study showed that the 1/F noise in semiconductor lasers has an ultimate physical limit based upon similar factors to fundamental noise generated in other semiconductor and solid state devices. The study also showed that both additive and multiplicative noise can be a significant detriment to the performance of RF phased arrays especially in regard to very low sidelobe performance and ultimate beam steering accuracy. The final result is that a noise power related term must be included in a complete analysis of the noise spectrum of any semiconductor device including semiconductor lasers. |
| NASA分類 | Lasers and Masers |
| レポートNO | 97N23282
AD-A321856
NASA-CR-205047
NAS 1.26:205047
RL-TR-96-203 |
| 権利 | No Copyright |
