タイトル | Non-destructive Testing (NDT) of metal cracks using a high Tc rf-SQUID and eddy current method |
本文(外部サイト) | http://hdl.handle.net/2060/19960000294 |
著者(英) | Ruan, J. Z.; Lu, D. F.; Han, S. G.; Wong, K. W.; Sun, G. F.; Fan, Chang-Xin |
著者所属(英) | Midwest Superconductivity, Inc. |
発行日 | 1995-04-01 |
言語 | eng |
内容記述 | A SQUID is the most sensitive device to detect change in magnetic field. A nondestructive testing (NDT) device using high temperature SQUID's and eddy current method will be much more sensitive than those currently used eddy current systems, yet much cheaper than one with low temperature SQUID's. In this paper, we present our study of such a NDT device using a high temperature superconducting rf-SQUID as a gradiometer sensor. The result clearly demonstrates the expected sensitivity of the system, and indicates the feasibility of building a portable HTS SQUID NDT device with the help from cryocooler industry. Such a NDT device will have a significant impact on metal corrosion or crack detection technology. |
NASA分類 | QUALITY ASSURANCE AND RELIABILITY |
レポートNO | 96N10294 |
権利 | No Copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/106081 |