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タイトルInflight resistance measurement on high-T(sub c) superconducting thin films exposed to orbital atomic oxygen on CONCAP-2 (STS-46)
本文(外部サイト)http://hdl.handle.net/2060/19950021214
著者(英)Nerren, P. D.; Gregory, J. C.; Kwok, Hoi; Bijvoet, J. A.; Cross, J. B.; Raistrick, I. D.; Turner, L. G.; Raiker, G. N.; Sutherland, W. T.; Mogro-Camperso, A.
著者所属(英)NASA Marshall Space Flight Center
発行日1995-02-01
言語eng
内容記述In 1992, UAH (University of Alabama in Huntsville) conducted a unique experiment on STS-46 in which YBa2Cu3O7 (commonly known as '1-2-3' superconductor) high-T(c) superconducting thin film samples prepared at three different laboratories were exposed to 5 eV atomic oxygen in low Earth orbit on the ambient and 320 C hot plate during the first flight of the CONCAP-2 (Complex Autonomous Payload) experiment carrier. The resistance of the thin films was measured in flight during the atomic oxygen exposure and heating cycle. Superconducting properties were measured in the laboratory before and after the flight by the individual experimenters. Films with good superconducting properties, and which were exposed to the oxygen flux, survived the flight including those heated to 320 C (600 K) with properties essentially unchanged, while other samples which were heated but not exposed to oxygen were degraded. The properties of other flight controls held at ambient temperature appear unchanged and indistinguishable from those of ground controls, whether exposed to oxygen or not.
NASA分類ELECTRONICS AND ELECTRICAL ENGINEERING
レポートNO95N27635
権利No Copyright
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/107212


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