| タイトル | Innovative instrumentation for mineralogical and elemental analyses of solid extraterrestrial surfaces: The Backscatter Moessbauer Spectrometer/X Ray Fluorescence analyzer (BaMS/XRF) |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940030953 |
| 著者（英） | Agresti, D. G.; Shelfer, T. D.; Morris, Richard V.; Nguyen, T.; Wills, E. L. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 1994-01-01 |
| 言語 | eng |
| 内容記述 | We have developed a four-detector research-grade backscatter Moessbauer spectrometer (BaMS) instrument with low resolution x-ray fluorescence analysis (XRF) capability. A flight-qualified instrument based on this design would be suitable for use on missions to the surfaces of solid solar-system objects (Moon, Mars, asteroids, etc.). Target specifications for the flight instrument are as follows: mass less than 500 g; volumes less than 300 cu cm; and power less than 2 W. The BaMS/XRF instrument would provide data on the oxidation state of iron and its distribution among iron-bearing mineralogies and elemental composition information. This data is a primary concern for the characterization of extraterrestrial surface materials. |
| NASA分類 | INORGANIC AND PHYSICAL CHEMISTRY |
| レポートNO | 94N35459 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/111426 |
