| タイトル | A mineralogical instrument for planetary applications |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940030902 |
| 著者（英） | Blake, David F.; Bish, David L.; Vaniman, David T. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 1994-01-01 |
| 言語 | eng |
| 内容記述 | The mineralogy of a planetary surface can be used to identify the provenance of soil or sediment and reveal the volcanic, metamorphic and/or sedimentological history of a particular region. We have discussed elsewhere the applications and the instrument design of possible X-ray diffraction and X-ray fluorescence (XRD/XRF) devices for the mineralogical characterization of planetary surfaces. In this abstract we evaluate some aspects of sample-detector geometry and sample collection strategies. |
| NASA分類 | LUNAR AND PLANETARY EXPLORATION |
| レポートNO | 94N35408 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/111471 |
