| タイトル | Ampoule failure sensor time response testing: Experiment 1 |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940025694 |
| 著者（英） | Watring, D. A.; Johnson, M. L. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 1994-04-01 |
| 言語 | eng |
| 内容記述 | The response time of an ampoule failure sensor exposed to a liquid or vapor gallium-arsenide (GaAs) is investigated. The experimental configuration represents the sample/ampoule cartridge assembly used in NASA's Crystal Growth Furnace (CGF). The sensor is a chemical fuse made from a metal with which the semiconductor material reacts more rapidly than it does with the containing cartridge. For the III-IV compound of GaAs, a platinum metal was chosen based on the reaction of platinum and arsenic at elevated temperatures which forms a low melting eutectic. Ampoule failure is indicated by a step change in resistance of the failure sensor on the order of megohms. The sensors will increase the safety of crystal growth experiments by providing an indication that an ampoule has failed. Experimental results indicate that the response times (after a known ampoule failure) for the 0.003 and 0.010 inch ampoule failure sensors are 2.4 and 3.6 minutes, respectively. This ampoule failure sensor will be utilized in the CGF during the second United States Microgravity Laboratory Mission (USML-2) and is the subject of a NASA patent application. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 94N30199
NASA-TM-108449
NAS 1.15:108449 |
| 権利 | No Copyright |
