| タイトル | Cryogenic probe station for use in automated microwave and noise figure measurements |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940024497 |
| 著者（英） | Alterovitz, Samuel A.; Romanofsky, Robert R.; Young, Paul G.; Ebihara, Ben T.; Taub, Susan R. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1994-03-01 |
| 言語 | eng |
| 内容記述 | A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This 'CryoProbe Station' can wafer-probe devices and circuits at cryogenic temperatures, thus eliminating the need for wire bonds. The system operates under vacuum created by a sorption pump. It uses an open cycle cooling system that can be cooled with either liquid nitrogen or liquid helium. Presently, it can reach temperatures, as low as 80 K and 37 K for each of the coolants, respectively. The temperature can be raised using a heater and it is stabilized to within 0.2 K by use of a temperature controller. The CryoProbe Station features a 1 by 2 inch stage that can hold large circuits and calibration standards simultaneously. The system is used with a Hewlett Packard 8510C Automatic Network Analyzer (ANA) to obtain S-parameter data over the frequency range 0.045-26.5 GHz. S-parameter data on HEMT (high electron mobility transistors) devices has been obtained with this station. With the use of DEEMBED software from NIST, detailed transmission line studies have been performed. Although the CryoProbe Station is designed for frequencies up to 26.5 GHz, useful transmission line data has been obtained for frequencies as high as 40 GHz. The CryoProbe station has also been used with the ATN noise figure measurement system to perform automatic, temperature dependent noise figure measurements. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 94N29000
NASA-TM-106560
E-8726
NAS 1.15:106560 |
| 権利 | No Copyright |
|
