| タイトル | Characterization of convection related defects in II-VI compound semiconductors |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940017305 |
| 著者（英） | Witt, August F. |
| 著者所属（英） | Massachusetts Inst. of Tech. |
| 発行日 | 1993-12-01 |
| 言語 | eng |
| 内容記述 | The research carried out under NAG8-913, 'Characterization of Convection Related Defects in II-VI Compound Semiconductors', was aimed at exploration of the potential of axial magnetic fields for melt stabilization when applied in Bridgman geometry to the growth of HgMnTe. The thrust of the work was directed at the experimental establishment of the limits of magnetic melt stabilization during crystal growth and at the analytical verification of the effects of stabilization on critical materials properties. The data obtained indicate noticeable stabilization effects, particularly as far as the formation of microscopic compositional inhomogeneities is concerned. The effects of magnetic fields on precipitate formation are found to be minor. Magnetic field effects were investigated for both 'Bridgman' and 'travelling heater' geometries. The research was conducted during the period from May 22 to September 30, 1992. |
| NASA分類 | SOLID-STATE PHYSICS |
| レポートNO | 94N21778
NASA-CR-194704
NAS 1.26:194704 |
| 権利 | No Copyright |
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