| タイトル | Detection of feed-through faults in CMOS storage elements |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940017248 |
| 著者（英） | Malaiya, Yashwant K.; Al-Assadi, Waleed K.; Jayasumana, Anura P. |
| 著者所属（英） | Colorado State Univ. |
| 発行日 | 1992-01-01 |
| 言語 | eng |
| 内容記述 | In testing sequential circuits, internal faults in the storage elements (SE's) are sometimes modeled as stuck-at faults in the combinational circuits surrounding the SE. The detection of some transistor-level faults that cannot be modeled as stuck-at are considered. These feed-through faults cause the cell to become either data-feed-through, which makes the cell combinational, or clock-feed-through, which causes the clock signal or its complement to appear at the output. Under such faults, the cell does not function as a memory element. Here it is shown that such faults may or may not be detected depending on delays involved. Conditions under which race-ahead occurs are identified. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 94N21721 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/114879 |
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