| タイトル | Low power arcjet system spacecraft impacts |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940013383 |
| 著者（英） | Sarmiento, Charles J.; Bogorad, A. L.; Pencil, Eric J.; Lichtin, D. A.; Palchefsky, J. W. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1993-06-01 |
| 言語 | eng |
| 内容記述 | Application of electrothermal arcjets on communications satellites requires assessment of integration concerns identified by the user community. Perceived risks include plume contamination of spacecraft materials, induced arcing or electrostatic discharges between differentially charged spacecraft surfaces, and conducted and radiated electromagnetic interference (EMI) for both steady state and transient conditions. A Space Act agreement between Martin Marietta Astro Space, the Rocket Research Company, and NASA's Lewis Research Center was established to experimentally examine these issues. Spacecraft materials were exposed to an arcjet plume for 40 hours, representing 40 weeks of actual spacecraft life, and contamination was characterized by changes in surface properties. With the exception of the change in emittance of one sample, all measurable changes in surface properties resulted in acceptable end of life characteristics. Charged spacecraft samples were benignly and consistently reduced to ground potential during exposure to the powered arcjet plume, suggesting that the arcjet could act as a charge control device on spacecraft. Steady state EMI signatures obtained using two different power processing units were similar to emissions measured in a previous test. Emissions measured in UHF, S, C, Ku and Ka bands obtained a null result which verified previous work in the UHF, S, and C bands. Characteristics of conducted and radiated transient emissions appear within standard spacecraft susceptibility criteria. |
| NASA分類 | SPACECRAFT PROPULSION AND POWER |
| レポートNO | 94N17856
NASA-TM-106307
E-8048
NAS 1.15:106307
AIAA PAPER 93-2392 |
| 権利 | No Copyright |
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