| タイトル | Heat flux measurements on ceramics with thin film thermocouples |
| 本文（外部サイト） | http://hdl.handle.net/2060/19940006838 |
| 著者（英） | Anderson, Robert C.; Liebert, Curt H.; Holanda, Raymond |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1993-11-01 |
| 言語 | eng |
| 内容記述 | Two methods were devised to measure heat flux through a thick ceramic using thin film thermocouples. The thermocouples were deposited on the front and back face of a flat ceramic substrate. The heat flux was applied to the front surface of the ceramic using an arc lamp Heat Flux Calibration Facility. Silicon nitride and mullite ceramics were used; two thicknesses of each material was tested, with ceramic temperatures to 1500 C. Heat flux ranged from 0.05-2.5 MW/m2(sup 2). One method for heat flux determination used an approximation technique to calculate instantaneous values of heat flux vs time; the other method used an extrapolation technique to determine the steady state heat flux from a record of transient data. Neither method measures heat flux in real time but the techniques may easily be adapted for quasi-real time measurement. In cases where a significant portion of the transient heat flux data is available, the calculated transient heat flux is seen to approach the extrapolated steady state heat flux value as expected. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 94N11310
NASA-TM-106305
E-7963
NAS 1.15:106305 |
| 権利 | No Copyright |
