| タイトル | Laser-based strain measurements for high temperature applications |
| 本文（外部サイト） | http://hdl.handle.net/2060/19930004487 |
| 著者（英） | Lant, Christian T. |
| 著者所属（英） | Sverdrup Technology, Inc. |
| 発行日 | 1992-09-01 |
| 言語 | eng |
| 内容記述 | The Instrumentation and Control Technology Division at NASA Lewis Research Center has developed a high performance optical strain measurement system for high temperature applications using wires and fibers. The system is based on Yamaguchi's two-beam speckle-shift strain measurement technique. The system automatically calculates surface strains at a rate of 5 Hz using a digital signal processor in a high speed micro-computer. The system is fully automated, and can be operated remotely. This report describes the speckle-shift technique and the latest NASA system design. It also shows low temperature strain test results obtained from small diameter tungsten, silicon carbide, and sapphire specimens. These specimens are of interest due to their roles in composite materials research at NASA Lewis. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 93N13675 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/125127 |
