| タイトル | Taguchi methods in electronics: A case study |
| 本文（外部サイト） | http://hdl.handle.net/2060/19920019213 |
| 著者（英） | Kissel, R. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 1992-05-01 |
| 言語 | eng |
| 内容記述 | Total Quality Management (TQM) is becoming more important as a way to improve productivity. One of the technical aspects of TQM is a system called the Taguchi method. This is an optimization method that, with a few precautions, can reduce test effort by an order of magnitude over conventional techniques. The Taguchi method is specifically designed to minimize a product's sensitivity to uncontrollable system disturbances such as aging, temperature, voltage variations, etc., by simultaneously varying both design and disturbance parameters. The analysis produces an optimum set of design parameters. A 3-day class on the Taguchi method was held at the Marshall Space Flight Center (MSFC) in May 1991. A project was needed as a follow-up after the class was over, and the motor controller was selected at that time. Exactly how to proceed was the subject of discussion for some months. It was not clear exactly what to measure, and design kept getting mixed with optimization. There was even some discussion about why the Taguchi method should be used at all. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 92N28456
NAS 1.15:103586
NASA-TM-103586 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/126679 |
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