| タイトル | Ion microprobe elemental analyses of impact features on interplanetary dust experiment sensor surfaces |
| 本文（外部サイト） | http://hdl.handle.net/2060/19920014075 |
| 著者（英） | Griffis, Dieter P.; Hunter, Jerry L.; Wortman, Jim J.; Simon, Charles G. |
| 著者所属（英） | Institute for Space Science and Technology, Inc. |
| 発行日 | 1992-01-01 |
| 言語 | eng |
| 内容記述 | Hypervelocity impact features from very small particles (less than 3 microns in diameter) on several of the electro-active dust sensors used in the Interplanetary Dust Experiment (IDE) were subjected to elemental analysis using an ion microscope. The same analytical techniques were applied to impact and containment features on a set of ultra-pure, highly polished single crystal germanium wafer witness plates that were mounted on tray B12. Very little unambiguously identifiable impactor debris was found in the central craters or shatter zones of small impacts in this crystalline surface. The surface contamination, ubiquitous on the surface of the Long Duration Exposure Facility, has greatly complicated data collection and interpretation from microparticle impacts on all surfaces. |
| NASA分類 | ASTROPHYSICS |
| レポートNO | 92N23318 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/127542 |
