| タイトル | Quantification of contaminants associated with LDEF |
| 本文（外部サイト） | http://hdl.handle.net/2060/19920014045 |
| 著者（英） | Nishimura, L. S.; Crutcher, E. R.; Warner, K. J.; Wascher, W. W. |
| 著者所属（英） | Boeing Co. |
| 発行日 | 1992-01-01 |
| 言語 | eng |
| 内容記述 | The quantification of contaminants on the Long Duration Exposure Facility (LDEF) and associated hardware or tools is addressed. The purpose of this study was to provide a background data base for the evaluation of the surface of the LDEF and the effects of orbital exposure on that surface. This study necessarily discusses the change in the distribution of contaminants on the LDEF with time and environmental exposure. Much of this information may be of value for the improvement of contamination control procedures during ground based operations. The particulate data represents the results of NASA contractor monitoring as well as the results of samples collected and analyzed by the authors. The data from the tapelifts collected in the Space Shuttle Bay at Edwards Air Force Base and KSC are also presented. The amount of molecular film distributed over the surface of the LDEF is estimated based on measurements made at specific locations and extrapolated over the surface area of the LDEF. Some consideration of total amount of volatile-condensible materials available to form the resultant deposit is also presented. All assumptions underlying these estimates are presented along with the rationale for the conclusions. Each section is presented in a subsection for particles and another for molecular films. |
| NASA分類 | INORGANIC AND PHYSICAL CHEMISTRY |
| レポートNO | 92N23288 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/127571 |
