| タイトル | Upper bound SEU rate for devices in an isotropic or nonisotropic flux |
| 本文（外部サイト） | http://hdl.handle.net/2060/19920007507 |
| 著者（英） | Edmonds, Larry D. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1991-08-01 |
| 言語 | eng |
| 内容記述 | A method for constructing upper bound estimates for device single event upset (SEU) rates is presented. A directional Heinrich flux, as a function of direction, must be known. A computer code, included, converts the directional Heinrich flux into an 'effective flux'. The effective flux provides a simple way to estimate upper bound SEU rates for devices with a known normal incident cross section versus LET curve. |
| NASA分類 | ATOMIC AND MOLECULAR PHYSICS |
| レポートNO | 92N16725
NAS 1.26:189765
JPL-PUBL-91-32
NASA-CR-189765 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/128905 |
