| タイトル | Imaging analysis of LDEF craters |
| 本文（外部サイト） | http://hdl.handle.net/2060/19920003709 |
| 著者（英） | Fleming, R. H.; Radicatidibrozolo, F.; Chakel, J. A.; Bunch, T. E.; Harris, D. W. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 1991-01-01 |
| 言語 | eng |
| 内容記述 | Two small craters in Al from the Long Duration Exposure Facility (LDEF) experiment tray A11E00F (no. 74, 119 micron diameter and no. 31, 158 micron diameter) were analyzed using Auger electron spectroscopy (AES), time-of-flight secondary ion mass spectroscopy (TOF-SIMS), low voltage scanning electron microscopy (LVSEM), and SEM energy dispersive spectroscopy (EDS). High resolution images and sensitive elemental and molecular analysis were obtained with this combined approach. The result of these analyses are presented. |
| NASA分類 | SPACECRAFT DESIGN, TESTING AND PERFORMANCE |
| レポートNO | 92N12927 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/129799 |
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