| タイトル | Atomic oxygen degradation of Intelsat 4-type solar array interconnects: Laboratory investigations |
| 本文（外部サイト） | http://hdl.handle.net/2060/19910011973 |
| 著者（英） | Cross, J. B.; Koontz, S. L.; Kirkendahl, T. D.; Hoffbauer, M. A. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 1991-03-01 |
| 言語 | eng |
| 内容記述 | A Hughes 506 type communication satellite belonging to the Intelsat organization was marooned in low Earth orbit on March 14, 1990, following failure of the Titan third stage to separate properly. The satellite, Intelsat VI, was designed for service in geosynchronous orbit and contains several material configurations which are susceptible to attack by atomic oxygen. Analysis showed the silver foil interconnects in the satellite photovoltaic array to be the key materials issue because the silver is exposed directly to the atomic oxygen ram flux. The results are reported of atomic oxygen degradation testing of Intelsat VI type silver foil interconnects both as virgin material and in a configured solar cell element. Test results indicate that more than 80 pct. of the original thickness of silver in the Intelsat VI solar array interconnects should remain after completion of the proposed Space Shuttle rescue and/or reboost mission. |
| NASA分類 | METALLIC MATERIALS |
| レポートNO | 91N21286
NAS 1.15:102175
NASA-TM-102175
S-625 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/133210 |
