| タイトル | Reliability and quality EEE parts issues |
| 本文（外部サイト） | http://hdl.handle.net/2060/19910007715 |
| 著者（英） | Feigenbaum, Irwin; Barney, Dan |
| 著者所属（英） | NASA Headquarters |
| 発行日 | 1990-08-01 |
| 言語 | eng |
| 内容記述 | NASA policy and procedures are established which govern the selection, testing, and application of electrical, electronic, and electromechanical (EEE) parts. Recent advances in the state-of-the-art of electronic parts and associated technologies can significantly impact the electronic designs and reliability of NASA space transportation avionics. Significant issues that result from these advances are examined, including: recent advances in microelectronics technology (as applied to or considered for use in NASA projects); electron packaging technology advances (concurrent with, and as a result of, the development of the advanced microelectronic devices); availability of parts used in space avionics; and standardization and integration of parts activities between projects, centers, and contractors. |
| NASA分類 | QUALITY ASSURANCE AND RELIABILITY |
| レポートNO | 91N17028 |
| 権利 | No Copyright |
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