| タイトル | Development and characterization of PdCr temperature-compensated wire resistance strain gage |
| 本文（外部サイト） | http://hdl.handle.net/2060/19900004445 |
| 著者（英） | Lei, Jih-Fen |
| 著者所属（英） | Sverdrup Technology, Inc. |
| 発行日 | 1989-10-01 |
| 言語 | eng |
| 内容記述 | A temperature-compensated resistance static strain gage with potential to be used to 600 C was recently developed. Gages were fabricated from specially developed palladium-13 w/o chromium (Pd-13Cr) wire and platinum (Pt) compensator. When bonded to high temperature Hastelloy X, the apparent strain from room temperature to 600 C was within 400 microstrain for gages with no preheat treatment and within 3500 microstrain for gages with 16 hours prestabilization at 640 C. The apparent strain versus temperature relationship of stabilized PdCr gages were repeatable with the reproducibility within 100 microstrain during three thermal cycles to 600 C and an 11 hours soak at 600 C. The gage fabrication, construction and installation is described. Also, the coating system used for this compensated resistance strain gage is explained. The electrical properties of the strain sensing element and main characteristics of the compensated gage including apparent strain, drift and reproducibility are discussed. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 90N13761
NASA-CR-185153
E-5112
NAS 1.26:185153 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/139611 |
