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タイトルGrain boundary oxidation and its effects on high temperature fatigue life
本文(外部サイト)http://hdl.handle.net/2060/19890003547
著者(英)Oshida, Yoshiki; Liu, H. W.
著者所属(英)Syracuse Univ.
発行日1986-10-01
言語eng
内容記述Fatigue lives at elevated temperatures are often shortened by creep and/or oxidation. Creep causes grain boundary void nucleation and grain boundary cavitation. Grain boundary voids and cavities will accelerate fatigue crack nucleation and propagation, and thereby shorten fatigue life. The functional relationships between the damage rate of fatigue crack nucleation and propagation and the kinetic process of oxygen diffusion depend on the detailed physical processes. The kinetics of grain boundary oxidation penetration was investigated. The statistical distribution of grain boundary penetration depth was analyzed. Its effect on high temperature fatigue life are discussed. A model of intermittent micro-ruptures of grain boundary oxide was proposed for high temperature fatigue crack growth. The details of these studies are reported.
NASA分類METALLIC MATERIALS
レポートNO89N12918
権利No Copyright
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/144637


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