| タイトル | Special topics in infrared interferometry |
| 本文（外部サイト） | http://hdl.handle.net/2060/19850020482 |
| 著者（英） | Hanel, R. A. |
| 著者所属（英） | Max-Planck-Inst. fuer Physik und Astrophysik; NASA Goddard Space Flight Center |
| 発行日 | 1985-01-01 |
| 言語 | German |
| 内容記述 | Topics in IR interferometry related to the development of a Michelson interferometer are treated. The selection and reading of the signal from the detector to the analog to digital converter is explained. The requirements for the Michelson interferometer advance speed are deduced. The effects of intensity modulation on the interferogram are discussed. Wavelength and intensity calibration of the interferometer are explained. Noise sources (Nyquist or Johnson noise, phonon noise), definitions of measuring methods of noise, and noise measurements are presented. |
| NASA分類 | OPTICS |
| レポートNO | 85N28794
NASA-TM-87472
NAS 1.15:87472
MPE-189 |
| 権利 | No Copyright |
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