| タイトル | ケルビンプローブ表面力顕微鏡の開発とその基礎特性 |
| その他のタイトル | Development of Kelvin probe force microscopy and its basic properties |
| 著者（日） | 佐藤, 宣夫; 脇田, 和樹 |
| 著者（英） | Satoh, Nobuo; Wakita, Kazuki |
| 著者所属（日） | 千葉工業大学; 千葉工業大学 |
| 著者所属（英） | Chiba Institute of Technology; Chiba Institute of Technology |
| 発行日 | 2014-01-01 |
| 発行機関など | 千葉工業大学
Chiba Institute of Technology |
| 刊行物名 | 千葉工業大学研究報告 理工編
Report of Chiba Institute of Technology |
| 号 | 61 |
| 開始ページ | 53 |
| 終了ページ | 58 |
| 刊行年月日 | 2014-01-01 |
| 言語 | jpn
eng |
| 抄録 | Surface science techniques are used to study the material properties of organic and inorganic materials. One of the most useful and powerful tools for this is atomic force microscopy in dynamic-mode （DFM). DFM can be used not only for topographic imaging but also to evaluate the physical properties of materials on the micro- and nano-scale. Kelvin probe force microscopy （KFM ）is an application of scanning probe microscopic technology that can measure surface potential regardless of material property （i. e., inorganic or organic）. The amplitude modulation （AM） detection method coupled with precise probe-control is also used in simultaneous scans of the topographic and surface potential over the same area. |
| 内容記述 | 形態: 図版あり
Physical characteristics: Original contains illustrations |
| キーワード | Atomic force microscopy; Amplitude modulation; Surface potential; Energy band diagram |
| 資料種別 | Departmental Bulletin Paper |
| NASA分類 | Instrumentation and Photography |
| ISSN | 0385-7026 |
| NCID | AN00142534 |
| SHI-NO | AA0062359005 |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/16130 |
