| タイトル | Surface profile changes of scuffed bearing surfaces |
| 本文（外部サイト） | http://hdl.handle.net/2060/19830009411 |
| 著者（英） | Jones, W. R., Jr.; Lauer, J. L.; Fung, S. S. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1982-01-01 |
| 言語 | eng |
| 内容記述 | A phase locked interference microscope capable of resolving depth differences to 30 A and planar displacements of 6000 A was constructed for the examination of the profiles of bearing surfaces without physical contact. This instrument was used to determine surface chemical reactivity by applying a drop of dilute alcoholic hydrochloric acid and measuring the profile of the solid surface before and after application of this probe. Scuffed bearing surfaces reacted much faster than unscuffed ones, but bearing surfaces which had been previously exposed to lubricants containing an organic chloride reacted much more slowly. In a separate series of experiments, a number of stainless steel plates were heated in a nitrogen atmosphere to different temperatures and their reactivity examined later at room temperature. The change of surface contour as a result of the probe reaction followed an Arrhenius type relation with respect to heat treatment temperature. This result could have implications on the scuffing mechanism. |
| NASA分類 | METALLIC MATERIALS |
| レポートNO | 83N17682
NAS 1.15:83055
E-1402
NASA-TM-83055 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/163557 |
