| タイトル | Toward the assessment of the susceptibility of a digital system to lightning upset |
| 本文（外部サイト） | http://hdl.handle.net/2060/19820007422 |
| 著者（英） | Masson, G. M.; Tront, J. G.; Graf, W.; Whalen, J. J.; Myers, J. M.; Martin, C. F. |
| 著者所属（英） | Virginia Polytechnic Inst. and State Univ. |
| 発行日 | 1981-12-01 |
| 言語 | eng |
| 内容記述 | Accomplishments and directions for further research aimed at developing methods for assessing a candidate design of an avionic computer with respect to susceptability to lightning upset are reported. Emphasis is on fault tolerant computers. Both lightning stress and shielding are covered in a review of the electromagnetic environment. Stress characterization, system characterization, upset detection, and positive and negative design features are considered. A first cut theory of comparing candidate designs is presented including tests of comparative susceptability as well as its analysis and simulation. An approach to lightning induced transient fault effects is included. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 82N15295 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/167256 |
