| タイトル | Flaw criticality of circular disbond defects in compressive laminates |
| 本文（外部サイト） | http://hdl.handle.net/2060/19810023652 |
| 著者（英） | Webster, J. D. |
| 著者所属（英） | Delaware Univ. |
| 発行日 | 1981-06-01 |
| 言語 | eng |
| 内容記述 | The compressive behavior of T300/5208 graphite-epoxy laminates containing circular delaminations was studied to determine the flaw criticality of two types of implanted defect, Kapton bag and Teflon film, on several laminate configurations. Defect size was varied. Results, presented in the form of residual strength curves, indicate that the Teflon film defect reduced strength more than the Kapton bad defect in 12-ply samples, but that two laminates (+ or - 45) sub 2s and (90/+ or - 45) sub s were insensitive to any implanted defect. A clear thickness effect was shown to exist for the (o/+ pr 45) sub ns laminate and was attributed to failure mode transition. The analytically predicted buckling loads show excellent agreement with experimental results and are useful in predicting failure mode transition. |
| NASA分類 | COMPOSITE MATERIALS |
| レポートNO | 81N32195
CCM-81-03
NASA-CR-164830 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/168025 |
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