| タイトル | Internal electrostatic discharge hazard risk assessment to the Galileo orbiter |
| 本文（外部サイト） | http://hdl.handle.net/2060/19810008593 |
| 著者（英） | Schmidt, R. E.; Andrews, J. C.; Leadon, R. E.; Treadaway, M. J. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech.|General Electric Co. |
| 発行日 | 1980-10-27 |
| 言語 | eng |
| 内容記述 | A worst case assessment was performed on the Command Data System (CDS) multilayer printed circuit board and an output power transformer module in the power subsystem. An estimate of the Jovian environment during the 35 hour orbit insertion was supplied by JPL and used as an input to calculate the electron transport into the Galileo components. A radiation shielding analysis computer code, CHARGE, calculated the electron transport deposition trapped in the anticipated sensitive areas of the multilayer board and transformer module. Based on these trapped charge calculations electric fields were calculated between the identified isolated areas and the spacecraft ground. The results of the assessment of electrostatic discharge (DSD) in the CDS multilayer printed circuit board indicate that the probability of ESD in the FR4 is low. The probability of ESD in the components attached to the multilayer board, however, is uncertain based on a lack of prior experimental data. |
| NASA分類 | LAUNCH VEHICLES AND SPACE VEHICLES |
| レポートNO | 81N17113
NASA-CR-163930 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/170148 |
