| タイトル | Voyager electronic parts radiation program, volume 1 |
| 本文（外部サイト） | http://hdl.handle.net/2060/19780007219 |
| 著者（英） | Stanley, A. G.; Price, W. E.; Martin, K. E. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1977-09-15 |
| 言語 | eng |
| 内容記述 | The Voyager spacecraft is subject to radiation from external natural space, from radioisotope thermoelectric generators and heater units, and from the internal environment where penetrating electrons generate surface ionization effects in semiconductor devices. Methods for radiation hardening and tests for radiation sensitivity are described. Results of characterization testing and sample screening of over 200 semiconductor devices in a radiation environment are summarized. |
| NASA分類 | SPACECRAFT DESIGN, TESTING AND PERFORMANCE |
| レポートNO | 78N15162
NASA-CR-155534
JPL-PUB-77-41-VOL-1 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/180248 |
