| タイトル | Secondary-electron-emission properties of conducting surfaces with application to multistage depressed collectors for microwave amplifiers |
| 本文（外部サイト） | http://hdl.handle.net/2060/19780003287 |
| 著者（英） | Forman, R. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1977-11-01 |
| 言語 | eng |
| 内容記述 | To improve the efficiency of high power microwave tubes, low secondary electron yield electrode surface for use in depressed collectors are needed. The secondary emission characteristics of a number of materials were investigated. The materials studied were beryllium, carbon (soot and pyrolytic graphite), copper, titanium carbide, and tantalum. Both total secondary yield delta and relative reflected primary yield were measured. These measurements were made in conjunction with Auger spectroscopy so that the secondary emission characteristics could be determined as a function of surface contamination or purity. The results show that low atomic weight elements, such as beryllium and carbon, have the lowest reflected primary yield and that roughening the surface of an electrode can markedly decrease secondary yield both for delta and reflected primaries. All factors considered, a roughened pyrolytic graphite surface showed the greatest potential for use as an electrode surface in depressed collectors. |
| NASA分類 | METALLIC MATERIALS |
| レポートNO | 78N11230
E-9233
NASA-TP-1097 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/180681 |
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