| タイトル | Study of limitations and attributes of microprocessor testing techniques |
| 本文（外部サイト） | http://hdl.handle.net/2060/19770018857 |
| 著者（英） | Sohl, W. E.; Mccaskill, R. |
| 著者所属（英） | Macrodata Corp. |
| 発行日 | 1977-03-17 |
| 言語 | eng |
| 内容記述 | All microprocessor units have a similar architecture from which a basic test philosophy can be adopted and used to develop an approach to test each module separately in order to verify the functionality of each module within the device using the input/output pins of the device and its instruction set; test for destructive interaction between functional modules; and verify all timing, status information, and interrupt operations of the device. Block and test flow diagrams are given for the 8080, 8008, 2901, 6800, and 1802 microprocessors. Manufacturers are listed and problems encountered in testing the modules are discussed. Test equipment and methods are described. |
| NASA分類 | COMPUTER OPERATIONS AND HARDWARE |
| レポートNO | 77N25801
NASA-CR-150284 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/182079 |
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