| タイトル | A survey of particle contamination in electronic devices |
| 本文（外部サイト） | http://hdl.handle.net/2060/19770007395 |
| 著者（英） | Adolphsen, J. W.; Kagdis, W. A.; Timmins, A. R. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1976-12-01 |
| 言語 | eng |
| 内容記述 | The experiences are given of a number of National Aeronautics and Space Administration (NASA) and Space and Missile System Organization (SAMSO) contractors with particle contamination, and the methods used for its prevention and detection, evaluates the bases for the different schemes, assesses their effectiveness, and identifies the problems associated with each. It recommends specific short-range tests or approaches appropriate to individual part-type categories and recommends that specific tasks be initiated to refine techniques and to resolve technical and application facets of promising solutions. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 77N14338
X-311-76-266
NASA-TM-X-71245 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/183653 |
