| タイトル | Method for measuring static Young's modulus of tungsten to 1900 K |
| 本文（外部サイト） | http://hdl.handle.net/2060/19720014808 |
| 著者（英） | Harrigill, W. T., Jr.; Krsek, A., Jr. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1972-04-01 |
| 言語 | eng |
| 内容記述 | An instrument system was developed and tested to measure static Young's modulus of elasticity of refractory metals in tension at temperatures to 1900 K. The extensometer uses capacitance displacement sensors for measuring total elongation of a specimen and incorporates a unique high-resolution remote zero-adjusting mechanism. Details of a method for calibrating capacitance displacement sensors at temperatures to 800 K are included. The system was built to adapt to a vacuum furnace on a tensile machine and was tested on unalloyed tungsten rod specimens. The test results show that the system can measure the modulus of tungsten to 1900 K to within a precision of + or - 5 percent. The uncertainty of the measurement is estimated to be of the same order as the precision. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 72N22458
E-6702
NASA-TN-D-6794 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/203629 |
