| タイトル | Lunar rilles: A catalog and method of classification |
| 本文（外部サイト） | http://hdl.handle.net/2060/19720006183 |
| 著者（英） | Oberbeck, V. R.; Morgan, R. B.; Lovas, M. J.; Greeley, R. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 1971-11-01 |
| 言語 | eng |
| 内容記述 | A representative sample of lunar rilles observed on Lunar Orbiter 4 and 5 photographs is presented. A method of classification of rilles is described which will provide a means of quantitatively grouping rilles of similar planemetric shape. The method is based on a finite Fourier approximation of the edge of the rille. It provides an adequate approximation to all planemetric characteristics of the rille except rille recurvature. |
| NASA分類 | SPACE SCIENCES |
| レポートNO | 72N13832
NASA-TM-X-62088 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/204487 |
