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タイトルDirect Measurement of Large, Diffuse, Optical Structures
本文(外部サイト)http://hdl.handle.net/2060/20040171459
著者(英)Feinberg, Lee; Saif, Babak N.; Atkinson, C.; Wyant, J. C.; Keski-Kuha, Ritva
著者所属(英)NASA Goddard Space Flight Center
発行日2004-01-01
言語eng
内容記述Digital Speckle Pattern Interferometry (DSPI) is a well-established method for the measurement of diffuse objects in experimental mechanics. DSPIs are phase shifting interferometers. Three or four bucket temporal phase shifting algorithms are commonly used to provide phase shifting. These algorithms are sensitive to vibrations and can not be used to measure large optical structures far away from the interferometer. In this research a simultaneous phase shifted interferometer, PhaseCam product of 4D Technology Corporation in Tucson Arizona, is modified to be a Simultaneous phase shifted Digital Speckle Pattern Interferometer (SDSPI). Repeatability, dynamic range, and accuracy of the SDSPI are characterized by measuring a 5 cm x 5 cm carbon fiber coupon.
NASA分類Instrumentation and Photography
権利Copyright, Distribution as joint owner in the copyright


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